Surface Anchoring Measurements:
Retardation vs. Voltage Local Probing

Yu. Nastishin, R. Polak, S. Shiyanovskii, V. Bodnar, O.D. Lavrentovich, Appl. Phys. Lett. 75, 202 (1999); J. Appl. Phys. 86, 4199 (1999).

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